IAP Session: FT-IR Sampling Capabilities in MRL

January 16, 2020

FT-IR Sampling Capabilities in MRL
Tim McClure
Thursday, Jan 31, 10:00am-2:00pm, 13-2137
No limit but advance sign up required (see contact below)
Signup by: 24-Jan-2019, single session event

The Materials Research Laboratories Analysis Shared Experimental Facility has an Extended range FT-IR & Microscope with a variety of sampling accessories that are available for the use of researchers. Come find out about the many sampling options now available for FT-IR.

Preregister via e-mail. Contact: Tim McClure, 13-4149, x8-6470, mtim@mit.edu